Browsing Chemistry Faculty Research, Publications and Presentations by Author "Naftel, SJ"
Now showing items 1-5 of 5
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Influence of sample oxidation on the nature of optical luminescence from porous silicon
Coulthard, I., WJ Antel, JW Freeland, TK Sham, et al. 2000. "Influence of sample oxidation on the nature of optical luminescence from porous silicon." Applied Physics Letters 77(4): 498-500.No abstract available. -
Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots
Reproduced from Zhang, P., SJ Naftel, and TK Sham. 2001. "Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots." Journal of Applied Physics 90(6): 2755-2759, with the permission of AIP Publishing.No abstract available. -
Soft x-ray excited optical luminescence: Some recent applications
Hu, YF, KH Tan, PS Kim, P. Zhang, et al. 2002. "Soft x-ray excited optical luminescence: Some recent applications." Review of Scientific Instruments 73(3): 1379-1381.No abstract available. -
Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum
Naftel, SJ, P. Zhang, PS Kim, TK Sham, et al. 2001. "Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum." Applied Physics Letters 78(13): 1847-1849.No abstract available. -
X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge
Reproduced from Sun, XH, YH Tang, P. Zhang, SJ Naftel, et al. 2001. "X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge." Journal of Applied Physics 90(12): 6379-6383, with the permission of AIP Publishing.No abstract available.