X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge
Loading...
Date
Authors
Sun, XH
Tang, YH
Zhang, P.
Naftel, SJ
Sammynaiken, R.
Sham, TK
Peng, HY
Zhang, YF
Wong, NB
Lee, ST
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
No abstract available.
Description
Keywords
Citation
Reproduced from Sun, XH, YH Tang, P. Zhang, SJ Naftel, et al. 2001. "X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge." Journal of Applied Physics 90(12): 6379-6383, with the permission of AIP Publishing.