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dc.contributor.authorDeng, Xiyan
dc.date.accessioned2014-12-16T15:07:16Z
dc.date.available2014-12-16T15:07:16Z
dc.date.issued2014-12-16
dc.identifier.urihttp://hdl.handle.net/10222/56020
dc.description.abstractThe peak position of wide angle x-ray diffraction patterns of nanocrystalline triacylglycerols is affected by the temperature. To observe this effect quantitatively, pure triacylglycerols and triacylglycerol mixtures were crystallized in a desired polymorph in capillaries or a Couette system. The crystallized samples were kept at different temperatures and shear rates. The detailed WAXD patterns were obtained using in-house x-ray and synchrotron x-ray sources. When the temperature increased, the d-spacing for the peaks with small d-spacing increased as well. However, the d-spacing for other peaks remained unchanged or just had a very small change. The relationship between differences of d-spacing for the peaks with small d-spacing and temperature can be used to estimate the real sample temperature, especially under higher shear rate. This provides a new way to monitor and control the temperature of the system under study and the effect of high shear rate on nanocrystalline triacylglycerol crystallization.en_US
dc.language.isoenen_US
dc.subjectTriacylglycerolsen_US
dc.subjectWide Angle X-Ray Diffractionen_US
dc.subjectTemperatureen_US
dc.titleEffect of Temperature on the Wide Angle X-Ray Diffraction of Nanocrystalline Triacylglycerolsen_US
dc.typeThesisen_US
dc.date.defence2014-12-09
dc.contributor.departmentDepartment of Process Engineering and Applied Scienceen_US
dc.contributor.degreeMaster of Scienceen_US
dc.contributor.external-examinerDr. Benedict Newlingen_US
dc.contributor.graduate-coordinatorGibson, Marken_US
dc.contributor.thesis-readerDr. Jan Haelssigen_US
dc.contributor.thesis-readerDr. Benedict Newlingen_US
dc.contributor.thesis-supervisorDr. Gianfranco Mazzantien_US
dc.contributor.ethics-approvalNot Applicableen_US
dc.contributor.manuscriptsNot Applicableen_US
dc.contributor.copyright-releaseNot Applicableen_US
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