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Helical magnetic order in MnSi thin films

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dc.contributor.authorKarhu, E. A.en_US
dc.contributor.authorKahwaji, S.en_US
dc.contributor.authorRobertson, M. D.en_US
dc.contributor.authorFritzsche, H.en_US
dc.contributor.authorKirby, B. J.en_US
dc.contributor.authorMajkrzak, C. F.en_US
dc.contributor.authorMonchesky, T. L.en_US
dc.date.accessioned2013-06-19T17:21:14Z
dc.date.available2013-06-19T17:21:14Z
dc.date.issued2011-08/01en_US
dc.description.abstractWe present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The helix wavelength of 2/Q=13.90.1 nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.en_US
dc.identifier.citationKarhu, E. A., S. Kahwaji, M. D. Robertson, H. Fritzsche, et al. 2011. "Helical magnetic order in MnSi thin films." Physical Review B (Condensed Matter and Materials Physics) 84(6): 0604044. doi:10.1103/PhysRevB.84.060404en_US
dc.identifier.issn1098-0121en_US
dc.identifier.issue6en_US
dc.identifier.startpage0604044en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.84.060404en_US
dc.identifier.urihttp://hdl.handle.net/10222/24555
dc.identifier.volume84en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.ispartofPhysical Review B (Condensed Matter and Materials Physics)en_US
dc.rights.holder©2011 American Physical Society
dc.subjectMagnetic structureen_US
dc.subjectMagnetic thin filmsen_US
dc.subjectManganese compoundsen_US
dc.subjectMolecular beam epitaxial growthen_US
dc.subjectTransmission electron microscopyen_US
dc.titleHelical magnetic order in MnSi thin filmsen_US
dc.typearticleen_US

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