Helical magnetic order in MnSi thin films
Date
2011-08/01
Authors
Karhu, E. A.
Kahwaji, S.
Robertson, M. D.
Fritzsche, H.
Kirby, B. J.
Majkrzak, C. F.
Monchesky, T. L.
Journal Title
Journal ISSN
Volume Title
Publisher
American Physical Society
Abstract
We present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The helix wavelength of 2/Q=13.90.1 nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.
Description
Keywords
Magnetic structure, Magnetic thin films, Manganese compounds, Molecular beam epitaxial growth, Transmission electron microscopy
Citation
Karhu, E. A., S. Kahwaji, M. D. Robertson, H. Fritzsche, et al. 2011. "Helical magnetic order in MnSi thin films." Physical Review B (Condensed Matter and Materials Physics) 84(6): 0604044. doi:10.1103/PhysRevB.84.060404