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dc.contributor.authorKarhu, E. A.en_US
dc.contributor.authorRoessler, U. K.en_US
dc.contributor.authorBogdanov, A. N.en_US
dc.contributor.authorKahwaji, S.en_US
dc.contributor.authorKirby, B. J.en_US
dc.contributor.authorFritzsche, H.en_US
dc.contributor.authorRobertson, M. D.en_US
dc.contributor.authorMajkrzak, C. F.en_US
dc.contributor.authorMonchesky, T. L.en_US
dc.date.accessioned2013-06-19T17:21:15Z
dc.date.available2013-06-19T17:21:15Z
dc.date.issued2012-03en_US
dc.identifier.citationKarhu, E. A., U. K. Roessler, A. N. Bogdanov, S. Kahwaji, et al. 2012. "Chiral modulations and reorientation effects in MnSi thin films." Physical Review B 85(9): 094429-094429. doi:10.1103/PhysRevB.85.094429en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.85.094429en_US
dc.identifier.urihttp://hdl.handle.net/10222/24557
dc.description.abstractNo abstract available.en_US
dc.relation.ispartofPhysical Review Ben_US
dc.titleChiral modulations and reorientation effects in MnSi thin filmsen_US
dc.typearticleen_US
dc.identifier.volume85en_US
dc.identifier.issue9en_US
dc.identifier.startpage094429en_US
dc.rights.holder©2012 American Physical Society
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