Helical magnetic order in MnSi thin films
Karhu, E. A.
Robertson, M. D.
Kirby, B. J.
Majkrzak, C. F.
Monchesky, T. L.
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We present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The helix wavelength of 2/Q=13.90.1 nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.
Karhu, E. A., S. Kahwaji, M. D. Robertson, H. Fritzsche, et al. 2011. "Helical magnetic order in MnSi thin films." Physical Review B (Condensed Matter and Materials Physics) 84(6): 0604044. doi:10.1103/PhysRevB.84.060404