| dc.contributor.author | Beaulieu, LY | en_US |
| dc.contributor.author | Cumyn, VK | en_US |
| dc.contributor.author | Eberman, KW | en_US |
| dc.contributor.author | Krause, LJ | en_US |
| dc.contributor.author | Dahn, JR | en_US |
| dc.date.accessioned | 2013-06-19T15:07:48Z | |
| dc.date.available | 2013-06-19T15:07:48Z | |
| dc.date.issued | 2001-08 | en_US |
| dc.identifier.citation | Beaulieu, LY, VK Cumyn, KW Eberman, LJ Krause, et al. 2001. "A system for performing simultaneous in situ atomic force microscopy/optical microscopy measurements on electrode materials for lithium-ion batteries." Review of Scientific Instruments 72(8): 3313-3319. doi:10.1063/1.1388214 | en_US |
| dc.identifier.issn | 0034-6748 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1063/1.1388214 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10222/22978 | |
| dc.description.abstract | No abstract available. | en_US |
| dc.relation.ispartof | Review of Scientific Instruments | en_US |
| dc.title | A system for performing simultaneous in situ atomic force microscopy/optical microscopy measurements on electrode materials for lithium-ion batteries | en_US |
| dc.type | article | en_US |
| dc.identifier.volume | 72 | en_US |
| dc.identifier.issue | 8 | en_US |
| dc.identifier.startpage | 3313 | en_US |
| dc.rights.holder | © 2001 American Institute of Physics | |
