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dc.contributor.authorGao, Y.en_US
dc.contributor.authorReimers, JNen_US
dc.contributor.authorDahn, JRen_US
dc.date.accessioned2013-06-19T15:07:47Z
dc.date.available2013-06-19T15:07:47Z
dc.date.issued1996-08en_US
dc.identifier.citationGao, Y., JN Reimers, and JR Dahn. 1996. "Changes in the voltage profile of Li/Li1+xMn2-xO4 cells as a function of x." Physical Review B 54(6): 3878-3883. doi:10.1103/PhysRevB.54.3878en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.54.3878en_US
dc.identifier.urihttp://hdl.handle.net/10222/22961
dc.description.abstractNo abstract available.en_US
dc.relation.ispartofPhysical Review Ben_US
dc.titleChanges in the voltage profile of Li/Li1+xMn2-xO4 cells as a function of xen_US
dc.typearticleen_US
dc.identifier.volume54en_US
dc.identifier.issue6en_US
dc.identifier.startpage3878en_US
dc.rights.holder© 1996 The American Physical Society
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