Browsing Dahn, Jeff by Author "WAY, BM"
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Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure
WAY, BM, JR DAHN, T. TIEDJE, K. MYRTLE, et al. 1992. "Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure." Physical Review B 46(3): 1697-1702. doi:10.1103/PhysRevB.46.1697No abstract available. -
Structure of Siloxene and Layered Polysilane (Si6h6)
DAHN, JR, BM WAY, E. FULLER, and JS TSE. 1993. "Structure of Siloxene and Layered Polysilane (Si6h6)." Physical Review B 48(24): 17872-17877. doi:10.1103/PhysRevB.48.17872No abstract available.