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dc.contributor.authorHolmes, Melanie
dc.date.accessioned2012-08-24T12:58:44Z
dc.date.available2012-08-24T12:58:44Z
dc.date.issued2012-08-24
dc.identifier.urihttp://hdl.handle.net/10222/15345
dc.description.abstractThree samples of Ti(C,N) were fabricated with 40 vol.% Ni3Al: Ti(C0.3N07), Ti(C0.5N0.5) and Ti(C0.7N0.3), as well as TiC with 10, 20, 30 and 40 vol.% Ni3Al binder addition by means of melt infiltration and sintering. Each sample was evaluated for density and microstructure before being placed in a flat cell for electrochemical testing. Open circuit potential was evaluated, followed by the application of a cathodic potential, whereby the response was tracked using Corrware corrosion software throughout the duration of potentiodynamic testing. Following corrosion testing, each sample was reevaluated for changes in microstructure and chemical composition. Ti(C,N) samples were found to have adequate resistance to corrosion, with increased resistance with increasing carbon content, however these samples demonstrated a greater frequency of breakdown and repassivation, suggesting a greater susceptibility to corrosion, despite the initial improved resistance. SEM imaging demonstrated significant crevice corrosion throughout. TiC-cermets demonstrated similar results in terms of SEM evaluation of microstructure. TiC-cermets with the lowest binder content (10 vol.% Ni3Al) demonstrated greater initial resistance to corrosion but also had the greatest potential for breakdown.en_US
dc.language.isoenen_US
dc.subjectCermets, Titanium carbonitride, titanium carbide, electrochemistryen_US
dc.titleElectrochemical Behaviour of Ti(C,N) and TiC Cermetsen_US
dc.date.defence2012-08-14
dc.contributor.departmentDepartment of Process Engineering and Applied Scienceen_US
dc.contributor.degreeMaster of Applied Scienceen_US
dc.contributor.external-examinerDr. Kuzaken_US
dc.contributor.graduate-coordinatorDr. Kipourosen_US
dc.contributor.thesis-readerDr. Farhaten_US
dc.contributor.thesis-supervisorDr. Kevin Plucknett, Dr. Georges Kipourosen_US
dc.contributor.ethics-approvalNot Applicableen_US
dc.contributor.manuscriptsNot Applicableen_US
dc.contributor.copyright-releaseNot Applicableen_US
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