Characterizing Artifact Generated by Passive Medical Devices in Modern Low-Field MRI: A Comparative Evaluation with Routine Clinical Practice

Abstract

Following implantation of a medical device, MRI follow-up imaging is often performed to evaluate device function, assess healing, and monitor treatment progression. Metallic components in devices create artifacts that affect diagnostic image quality in MRI. Modernized low-field MRIs now entering the clinic offer theoretical advantages over 1.5 T and 3 T MRI for imaging near metal. How these theoretical advantages translate to practice remains largely untested. An artifact characterization pipeline is developed here for the systematic evaluation of metal artifact created by 0.5 T, 1.5 T and 3 T MRI systems. Three high-use passive devices are evaluated in vitro with routine brain imaging protocols in current clinical use at our institution. Results generally indicate reduced artifact with 0.5 T, but artifact mitigating trade-offs within 1.5/3 T protocols were found to have considerable effects. The reduced trade-offs in 0.5 T protocols suggest an advantage for imaging near metallic devices in practice.