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dc.contributor.authorArriaga, Edgar A.en_US
dc.date.accessioned2014-10-21T12:34:37Z
dc.date.available1990
dc.date.issued1990en_US
dc.identifier.otherAAINN64386en_US
dc.identifier.urihttp://hdl.handle.net/10222/55172
dc.descriptionThe Zeeman effect which causes splitting of atomic lines has been applied in atomic absorption spectroscopy to correct for background absorption. In this study, two aspects of Zeeman background correction were investigated: (i) Fourier analysis of the response of the instruments using a.c. magnetic fields; (ii) application to discharge cells used as atomisers operated at atmospheric pressure.en_US
dc.descriptionFourier analysis was applied to study the profiles transmitted by hollow-cathode lamps surrounded by a.c. fields (Faraday configuration). Self-absorption (and its frequency shift) inside the lamp affected the amplitudes of the first and second harmonics. The following lines were explored: 585.2 nm Ne, 377.7 nm Ne, 670.8 nm Li, and 285.2 nm Mg.en_US
dc.descriptionAnother application of the Fourier analysis was in study of line overlap of absorbing species experiencing an a.c. field (Voigt configuration). The d.c. term, the first harmonic and the second harmonic (or their ratios) depended on concentration and were selective. The line overlap of Pt and Fe at 271.9 nm and the isotopic overlap of $\sp6$Li and $\sp7$Li at the 670.8 nm are reported.en_US
dc.descriptionApplication of Zeeman background correction to discharges operating at atmospheric pressure was feasible. The use of the Faraday configuration imposed some limitations in design; the Voigt configuration was applied to metallic Al, Cd, Co, Cr, Cu, Fe, Pb, Mg, Ni, Ag, and Zn atomised directly, and to Ag and Pb solutions. The detection limit of the system for Ag and Pb was estimated from indirect determination of the amounts of these metals deposited on the electrode prior to the atomisation step.en_US
dc.descriptionThesis (Ph.D.)--Dalhousie University (Canada), 1990.en_US
dc.languageengen_US
dc.publisherDalhousie Universityen_US
dc.publisheren_US
dc.subjectChemistry, Analytical.en_US
dc.subjectPhysics, Atomic.en_US
dc.titleTopics in the application of the Zeeman effect.en_US
dc.typetexten_US
dc.contributor.degreePh.D.en_US
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