Browsing by Subject "Focused ion beam microscopy"
Now showing items 1-1 of 1
-
The Characterization of TiC and Ti(C,N) Based Cermets with and without Mo2C
(2014-03-05)Titanium carbide (TiC) and titanium carbonitride (Ti(C,N)) are both common components in hard, wear resistant ceramic-metal composites, or cermets. In this study the intermetallic nickel aluminide (Ni3Al) has been used as ...