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dc.contributor.authorBessonette, PWRen_US
dc.contributor.authorWhite, MAen_US
dc.date.accessioned2013-08-23T15:58:35Z
dc.date.available2013-08-23T15:58:35Z
dc.date.issued1999-07en_US
dc.identifier.citationBessonette, PWR, and MA White. 1999. "Automated, low-temperature dielectric relaxation apparatus for measurement of air-sensitive, corrosive, hygroscopic, powdered samples." Review of Scientific Instruments 70(7): 3113-3114.en_US
dc.identifier.issn0034-6748en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1149873en_US
dc.identifier.urihttp://hdl.handle.net/10222/36079
dc.description.abstractAn automated apparatus for dielectric determinations on solid samples was designed to allow cryogenic measurements on air-sensitive, corrosive, hygroscopic, powdered samples, without determination of sample thickness, provided that it is uniform. A three-terminal design enabled measurements that were not affected by errors due to dimensional changes of the sample or the electrodes with changes in temperature. Meaningful dielectric data could be taken over the frequency range from 20 Hz to 1 MHz and the temperature range from 12 to 360 K. Tests with Teflon and with powdered NH4Cl gave results that were accurate within a few percent when compared with literature values.en_US
dc.relation.ispartofReview of Scientific Instrumentsen_US
dc.titleAutomated, low-temperature dielectric relaxation apparatus for measurement of air-sensitive, corrosive, hygroscopic, powdered samplesen_US
dc.typearticleen_US
dc.identifier.volume70en_US
dc.identifier.issue7en_US
dc.identifier.startpage3113en_US
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