Karhu, E. A.Kahwaji, S.Robertson, M. D.Fritzsche, H.Kirby, B. J.Majkrzak, C. F.Monchesky, T. L.2013-06-192013-06-192011-08/01Karhu, E. A., S. Kahwaji, M. D. Robertson, H. Fritzsche, et al. 2011. "Helical magnetic order in MnSi thin films." Physical Review B (Condensed Matter and Materials Physics) 84(6): 0604044. doi:10.1103/PhysRevB.84.0604041098-0121http://dx.doi.org/10.1103/PhysRevB.84.060404http://hdl.handle.net/10222/24555We present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The helix wavelength of 2/Q=13.90.1 nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.Magnetic structureMagnetic thin filmsManganese compoundsMolecular beam epitaxial growthTransmission electron microscopyarticle8460604044©2011 American Physical Society