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dc.contributor.authorZhang, P.en_US
dc.contributor.authorNaftel, SJen_US
dc.contributor.authorSham, TKen_US
dc.date.accessioned2013-08-12T16:56:02Z
dc.date.available2013-08-12T16:56:02Z
dc.date.issued2001-09en_US
dc.identifier.citationReproduced from Zhang, P., SJ Naftel, and TK Sham. 2001. "Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots." Journal of Applied Physics 90(6): 2755-2759, with the permission of AIP Publishing.en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1394899en_US
dc.identifier.urihttp://hdl.handle.net/10222/30991
dc.description.abstractNo abstract available.en_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.titleMultichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dotsen_US
dc.typearticleen_US
dc.identifier.volume90en_US
dc.identifier.issue6en_US
dc.identifier.startpage2755en_US
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