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dc.contributor.authorHill, IGen_US
dc.contributor.authorMcLean, ABen_US
dc.date.accessioned2013-06-19T15:24:37Z
dc.date.available2013-06-19T15:24:37Z
dc.date.issued1999-04en_US
dc.identifier.citationHill, IG, and AB McLean. 1999. "Detection of a Fermi level crossing in three-domain Si(111)-In(4x1)." Physical Review B 59(15): 9791-9793. doi:10.1103/PhysRevB.59.9791en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.59.9791en_US
dc.identifier.urihttp://hdl.handle.net/10222/24168
dc.description.abstractUsing photoemission and inverse photoemission, it has recently been demonstrated that single domain Si(111)-In(4 X 1) overlayers possess a clear Fermi level crossing at approximate to 0.6 azimuth of the 1 x I zone, which is coincident with the azimuth of the 4 X 1 zone, with inverse photoemission, and found a Fermi level crossing at approximate to 0.6. We have now detected Fermi level crossings in both single and three domain 4X1 overlayers. [S0163-1829(99)10415-6].en_US
dc.relation.ispartofPhysical Review Ben_US
dc.titleDetection of a Fermi level crossing in three-domain Si(111)-In(4x1)en_US
dc.typearticleen_US
dc.identifier.volume59en_US
dc.identifier.issue15en_US
dc.identifier.startpage9791en_US
dc.rights.holder©1999 The American Physical Society
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