| dc.contributor.author | WAY, BM | en_US |
| dc.contributor.author | DAHN, JR | en_US |
| dc.contributor.author | TIEDJE, T. | en_US |
| dc.contributor.author | MYRTLE, K. | en_US |
| dc.contributor.author | KASRAI, M. | en_US |
| dc.date.accessioned | 2013-06-19T15:08:00Z | |
| dc.date.available | 2013-06-19T15:08:00Z | |
| dc.date.issued | 1992-07 | en_US |
| dc.identifier.citation | WAY, BM, JR DAHN, T. TIEDJE, K. MYRTLE, et al. 1992. "Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure." Physical Review B 46(3): 1697-1702. doi:10.1103/PhysRevB.46.1697 | en_US |
| dc.identifier.issn | 0163-1829 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.46.1697 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10222/23265 | |
| dc.description.abstract | No abstract available. | en_US |
| dc.relation.ispartof | Physical Review B | en_US |
| dc.title | Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure | en_US |
| dc.type | article | en_US |
| dc.identifier.volume | 46 | en_US |
| dc.identifier.issue | 3 | en_US |
| dc.identifier.startpage | 1697 | en_US |
| dc.rights.holder | Copyright 1992 The American Physical Society | |
