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dc.contributor.authorNolas, GSen_US
dc.contributor.authorWard, JMen_US
dc.contributor.authorGryko, J.en_US
dc.contributor.authorQiu, L.en_US
dc.contributor.authorWhite, MAen_US
dc.date.accessioned2013-08-23T15:58:41Z
dc.date.available2013-08-23T15:58:41Z
dc.date.issued2001-10en_US
dc.identifier.citationNolas, GS, JM Ward, J. Gryko, L. Qiu, et al. 2001. "Transport properties of Na8Si46." Physical Review B 64(15): 153201-153201. Copyright © 2001 American Physical Society.en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.64.153201en_US
dc.identifier.urihttp://hdl.handle.net/10222/36196
dc.description.abstractWe report on transport properties of polycrystalline Na8Si46 in the temperature range 10 to 300 K. The compound is a type I clathrate with Na incorporated into polyhedra formed by framework Si atoms. Seebeck coefficient and resistivity measurements indicate metallic behavior, The thermal conductivity is low in comparison with crystalline Si, but high in comparison with other type I clathrates with a large contribution due to electronic conduction. The potential for thermoelectric applications also is discussed.en_US
dc.relation.ispartofPhysical Review Ben_US
dc.titleTransport properties of Na8Si46en_US
dc.typearticleen_US
dc.identifier.volume64en_US
dc.identifier.issue15en_US
dc.identifier.startpage153201en_US
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